Atomic Force Microscopy to Study Graphene Materials [PUBLICATIONS]
Today’s entry will be dedicated to Adrian Chlanda’s favorite research technique – atomic force microscopy (AFM), and its potential applications in the study of graphene materials and more. Due to the working principle of AFM (physical contact of the probe tip with the investigated surface), it is possible not only to visualize the surface but … Czytaj dalej Atomic Force Microscopy to Study Graphene Materials [PUBLICATIONS]
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